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Method and apparatus for analyzing a target material
Jean-Pierre Leburton
(Inventor)
Electrical and Computer Engineering
Physics
Coordinated Science Lab
Micro and Nanotechnology Lab
Beckman Institute for Advanced Science and Technology
Research output
:
Patent
Overview
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Keyphrases
Charge Concentration
66%
Controller
66%
Electrical Properties
33%
Sensing Data
33%
Via Hole
100%
Voltage Potential
66%
Engineering
Current Flow
100%
Sensing Data
100%
Target Material
100%