We have developed a MEMS-based testing stage that can quantitatively characterize both the electrical and mechanical properties of nanocrystalline metal films. This stage, which is SEM and TEM compatible, is a modified version of an earlier MEMS-based tensile testing stage (M. A. Haque and M. T. A. Saif, Proc. Natl. Acad Sci., 101(17), 6335-6340 (2004)). This modified stage requires a simpler fabrication procedure, involving less lithography and etching steps, and has higher sample yield compared to the earlier version. It allows for 4-point electrical resistivity measurement, and insitu tensile testing in SEM and TEM of free-standing nano-scale metal films. The stage was used to perform a tensile test and electrical resistivity measurement on 100-nm-thick aluminum films, the results of which are described.