Abstract
Using an atomic force microscope, we measured effective spring constants of stacks of graphene sheets (less than 5) suspended over photolithographically defined trenches in silicon dioxide. Measurements were made on layered graphene sheets of thicknesses between 2 and 8 nm, with measured spring constants scaling as expected with the dimensions of the suspended section, ranging from 1 to 5 Nm. When our data are fitted to a model for doubly clamped beams under tension, we extract a Young's modulus of 0.5 TPa, compared to 1 TPa for bulk graphite along the basal plane, and tensions on the order of 10-7 N.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 2558-2561 |
| Number of pages | 4 |
| Journal | Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures |
| Volume | 25 |
| Issue number | 6 |
| DOIs | |
| State | Published - Dec 19 2007 |
| Externally published | Yes |
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ASJC Scopus subject areas
- Condensed Matter Physics
- Electrical and Electronic Engineering
Cite this
Mechanical properties of suspended graphene sheets. / Frank, I. W.; Tanenbaum, D. M.; Van Der Zande, A. M.; McEuen, P. L.
In: Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, Vol. 25, No. 6, 19.12.2007, p. 2558-2561.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Mechanical properties of suspended graphene sheets
AU - Frank, I. W.
AU - Tanenbaum, D. M.
AU - Van Der Zande, A. M.
AU - McEuen, P. L.
PY - 2007/12/19
Y1 - 2007/12/19
N2 - Using an atomic force microscope, we measured effective spring constants of stacks of graphene sheets (less than 5) suspended over photolithographically defined trenches in silicon dioxide. Measurements were made on layered graphene sheets of thicknesses between 2 and 8 nm, with measured spring constants scaling as expected with the dimensions of the suspended section, ranging from 1 to 5 Nm. When our data are fitted to a model for doubly clamped beams under tension, we extract a Young's modulus of 0.5 TPa, compared to 1 TPa for bulk graphite along the basal plane, and tensions on the order of 10-7 N.
AB - Using an atomic force microscope, we measured effective spring constants of stacks of graphene sheets (less than 5) suspended over photolithographically defined trenches in silicon dioxide. Measurements were made on layered graphene sheets of thicknesses between 2 and 8 nm, with measured spring constants scaling as expected with the dimensions of the suspended section, ranging from 1 to 5 Nm. When our data are fitted to a model for doubly clamped beams under tension, we extract a Young's modulus of 0.5 TPa, compared to 1 TPa for bulk graphite along the basal plane, and tensions on the order of 10-7 N.
UR - http://www.scopus.com/inward/record.url?scp=37149007351&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=37149007351&partnerID=8YFLogxK
U2 - 10.1116/1.2789446
DO - 10.1116/1.2789446
M3 - Article
AN - SCOPUS:37149007351
VL - 25
SP - 2558
EP - 2561
JO - Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
JF - Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
SN - 1071-1023
IS - 6
ER -