Mechanical properties of suspended graphene sheets

I. W. Frank, D. M. Tanenbaum, A. M. Van Der Zande, P. L. McEuen

Research output: Contribution to journalArticle

Abstract

Using an atomic force microscope, we measured effective spring constants of stacks of graphene sheets (less than 5) suspended over photolithographically defined trenches in silicon dioxide. Measurements were made on layered graphene sheets of thicknesses between 2 and 8 nm, with measured spring constants scaling as expected with the dimensions of the suspended section, ranging from 1 to 5 Nm. When our data are fitted to a model for doubly clamped beams under tension, we extract a Young's modulus of 0.5 TPa, compared to 1 TPa for bulk graphite along the basal plane, and tensions on the order of 10-7 N.

Original languageEnglish (US)
Pages (from-to)2558-2561
Number of pages4
JournalJournal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Volume25
Issue number6
DOIs
StatePublished - Dec 19 2007
Externally publishedYes

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Graphene
graphene
mechanical properties
Mechanical properties
modulus of elasticity
Graphite
Microscopes
graphite
Elastic moduli
microscopes
Silica
silicon dioxide
scaling

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this

Mechanical properties of suspended graphene sheets. / Frank, I. W.; Tanenbaum, D. M.; Van Der Zande, A. M.; McEuen, P. L.

In: Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, Vol. 25, No. 6, 19.12.2007, p. 2558-2561.

Research output: Contribution to journalArticle

@article{d3054bf9b09f47329ce430187b91e620,
title = "Mechanical properties of suspended graphene sheets",
abstract = "Using an atomic force microscope, we measured effective spring constants of stacks of graphene sheets (less than 5) suspended over photolithographically defined trenches in silicon dioxide. Measurements were made on layered graphene sheets of thicknesses between 2 and 8 nm, with measured spring constants scaling as expected with the dimensions of the suspended section, ranging from 1 to 5 Nm. When our data are fitted to a model for doubly clamped beams under tension, we extract a Young's modulus of 0.5 TPa, compared to 1 TPa for bulk graphite along the basal plane, and tensions on the order of 10-7 N.",
author = "Frank, {I. W.} and Tanenbaum, {D. M.} and {Van Der Zande}, {A. M.} and McEuen, {P. L.}",
year = "2007",
month = "12",
day = "19",
doi = "10.1116/1.2789446",
language = "English (US)",
volume = "25",
pages = "2558--2561",
journal = "Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures",
issn = "1071-1023",
number = "6",

}

TY - JOUR

T1 - Mechanical properties of suspended graphene sheets

AU - Frank, I. W.

AU - Tanenbaum, D. M.

AU - Van Der Zande, A. M.

AU - McEuen, P. L.

PY - 2007/12/19

Y1 - 2007/12/19

N2 - Using an atomic force microscope, we measured effective spring constants of stacks of graphene sheets (less than 5) suspended over photolithographically defined trenches in silicon dioxide. Measurements were made on layered graphene sheets of thicknesses between 2 and 8 nm, with measured spring constants scaling as expected with the dimensions of the suspended section, ranging from 1 to 5 Nm. When our data are fitted to a model for doubly clamped beams under tension, we extract a Young's modulus of 0.5 TPa, compared to 1 TPa for bulk graphite along the basal plane, and tensions on the order of 10-7 N.

AB - Using an atomic force microscope, we measured effective spring constants of stacks of graphene sheets (less than 5) suspended over photolithographically defined trenches in silicon dioxide. Measurements were made on layered graphene sheets of thicknesses between 2 and 8 nm, with measured spring constants scaling as expected with the dimensions of the suspended section, ranging from 1 to 5 Nm. When our data are fitted to a model for doubly clamped beams under tension, we extract a Young's modulus of 0.5 TPa, compared to 1 TPa for bulk graphite along the basal plane, and tensions on the order of 10-7 N.

UR - http://www.scopus.com/inward/record.url?scp=37149007351&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=37149007351&partnerID=8YFLogxK

U2 - 10.1116/1.2789446

DO - 10.1116/1.2789446

M3 - Article

AN - SCOPUS:37149007351

VL - 25

SP - 2558

EP - 2561

JO - Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

JF - Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

SN - 1071-1023

IS - 6

ER -