TY - JOUR
T1 - Mechanical properties of suspended graphene sheets
AU - Frank, I. W.
AU - Tanenbaum, D. M.
AU - Van Der Zande, A. M.
AU - McEuen, P. L.
N1 - Funding Information:
The authors would like to thank the NSF for support through the Cornell Center for Materials Research, the Cornell Center for Nanoscale Systems, and the Cornell NanoScale Facility, a member of the National Nanotechnology Infrastructure Network. Additionally the authors would like to thank Leon Bellan, Scott Bunch, Scott Verbridge, Scott Berkley, Jeevak Parpia, and Harold Craighead for helpful discussions and support.
Copyright:
Copyright 2011 Elsevier B.V., All rights reserved.
PY - 2007
Y1 - 2007
N2 - Using an atomic force microscope, we measured effective spring constants of stacks of graphene sheets (less than 5) suspended over photolithographically defined trenches in silicon dioxide. Measurements were made on layered graphene sheets of thicknesses between 2 and 8 nm, with measured spring constants scaling as expected with the dimensions of the suspended section, ranging from 1 to 5 Nm. When our data are fitted to a model for doubly clamped beams under tension, we extract a Young's modulus of 0.5 TPa, compared to 1 TPa for bulk graphite along the basal plane, and tensions on the order of 10-7 N.
AB - Using an atomic force microscope, we measured effective spring constants of stacks of graphene sheets (less than 5) suspended over photolithographically defined trenches in silicon dioxide. Measurements were made on layered graphene sheets of thicknesses between 2 and 8 nm, with measured spring constants scaling as expected with the dimensions of the suspended section, ranging from 1 to 5 Nm. When our data are fitted to a model for doubly clamped beams under tension, we extract a Young's modulus of 0.5 TPa, compared to 1 TPa for bulk graphite along the basal plane, and tensions on the order of 10-7 N.
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U2 - 10.1116/1.2789446
DO - 10.1116/1.2789446
M3 - Article
AN - SCOPUS:37149007351
VL - 25
SP - 2558
EP - 2561
JO - Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
JF - Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
SN - 1071-1023
IS - 6
ER -