Using an atomic force microscope, we measured effective spring constants of stacks of graphene sheets (less than 5) suspended over photolithographically defined trenches in silicon dioxide. Measurements were made on layered graphene sheets of thicknesses between 2 and 8 nm, with measured spring constants scaling as expected with the dimensions of the suspended section, ranging from 1 to 5 Nm. When our data are fitted to a model for doubly clamped beams under tension, we extract a Young's modulus of 0.5 TPa, compared to 1 TPa for bulk graphite along the basal plane, and tensions on the order of 10-7 N.
|Original language||English (US)|
|Number of pages||4|
|Journal||Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures|
|State||Published - Dec 19 2007|
ASJC Scopus subject areas
- Condensed Matter Physics
- Electrical and Electronic Engineering