Measuring size dependent electrical properties from nanoneedle structures: Pt/ZnO Schottky diodes

Shimin Mao, Tao Shang, Byoungnam Park, Daniel D. Anderson, Shen J Dillon

Research output: Contribution to journalArticlepeer-review

Abstract

This work reports the fabrication and testing of nanoneedle devices with well-defined interfaces that are amenable to a variety of structural and electrical characterization, including transmission electron microscopy. Single Pt/ZnO nanoneedle Schottky diodes were fabricated by a top down method using a combination of electro-polishing, sputtering, and focused ion beam milling. The resulting structures contained nanoscale planar heterojunctions with low ideality factors, the dimensions of which were tuned to study size-dependent electrical properties. The diameter dependence of the Pt/ZnO diode barrier height is explained by a joule heating effect and/or electronic inhomogeneity in the Pt/ZnO contact area.

Original languageEnglish (US)
Article number153105
JournalApplied Physics Letters
Volume104
Issue number15
DOIs
StatePublished - Jan 1 2014

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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