Abstract
This work reports the fabrication and testing of nanoneedle devices with well-defined interfaces that are amenable to a variety of structural and electrical characterization, including transmission electron microscopy. Single Pt/ZnO nanoneedle Schottky diodes were fabricated by a top down method using a combination of electro-polishing, sputtering, and focused ion beam milling. The resulting structures contained nanoscale planar heterojunctions with low ideality factors, the dimensions of which were tuned to study size-dependent electrical properties. The diameter dependence of the Pt/ZnO diode barrier height is explained by a joule heating effect and/or electronic inhomogeneity in the Pt/ZnO contact area.
Original language | English (US) |
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Article number | 153105 |
Journal | Applied Physics Letters |
Volume | 104 |
Issue number | 15 |
DOIs | |
State | Published - Jan 1 2014 |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)