Measurements of Debye-Waller factors in TiAl from energy-filtered HOLZ line intensities

R. Holmestad, A. L. Weickenmeier, J. M. Zuo, J. C.H. Spence, Z. Horita

Research output: Contribution to journalConference articlepeer-review

Abstract

A new method to measure Debye Waller factors is reported in this article. The specimen analyzed is TiAl which was thinned by twin jet electropolishing. The measurement of the factors is necessary for the structure factor refinement in TiAl. It is aimed to get CBED pattern near a sparse zone axis, to extract line scans along HOLZ lines from the pattern. Two beam intensity is calculated to fit experiment and simulation by Debye Waller factor variations.

Original languageEnglish (US)
Pages (from-to)698-699
Number of pages2
JournalProceedings - Annual Meeting, Microscopy Society of America
StatePublished - Dec 1 1993
Externally publishedYes
EventProceedings of the 51st Annual Meeting Microscopy Society of America - Cincinnati, OH, USA
Duration: Aug 1 1993Aug 6 1993

ASJC Scopus subject areas

  • Engineering(all)

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