Abstract
We spectrally demonstrate for the first time that an amorphous selenium metal-semiconductor-metal detector can be used for the measurement of ultraviolet photons (200-400 nm) generated from a portable battery-operated microplasma that is used as a light source. An advantage of this low-cost detector is that the device structure allows photons to strike the light-sensitive layer directly rather than through electrodes or blocking layers. Another advantage is that despite operation at high electric fields of up to 43 V/\mu\hbox{m}$, the dark current of the detector at room temperature is 3 pA/\hbox{mm}2. Therefore, detector cooling is not required, and this facilitates portability for measurements on-site (i.e., in the field and away from a laboratory). Spectral response was monitored using a scanning monochromator, and it was compared with that obtained by a portable spectrometer fitted with a linear charge-coupled device detector. To demonstrate detector responsivity, emission signals with an appreciable signal-to-noise ratio were obtained by introducing nanogram amounts of the sample into the microplasma.
Original language | English (US) |
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Article number | 6399582 |
Pages (from-to) | 880-883 |
Number of pages | 4 |
Journal | IEEE Transactions on Electron Devices |
Volume | 60 |
Issue number | 2 |
DOIs | |
State | Published - 2013 |
Externally published | Yes |
Keywords
- Amorphous selenium (a-Se)
- metal-semiconductor- metal detector
- microplasma
- ultraviolet (UV) detector
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering