Measurement of UV from a microplasma by a microfabricated amorphous selenium detector

Shiva Abbaszadeh, Karim S. Karim, Vassili Karanassios

Research output: Contribution to journalArticlepeer-review


We spectrally demonstrate for the first time that an amorphous selenium metal-semiconductor-metal detector can be used for the measurement of ultraviolet photons (200-400 nm) generated from a portable battery-operated microplasma that is used as a light source. An advantage of this low-cost detector is that the device structure allows photons to strike the light-sensitive layer directly rather than through electrodes or blocking layers. Another advantage is that despite operation at high electric fields of up to 43 V/\mu\hbox{m}$, the dark current of the detector at room temperature is 3 pA/\hbox{mm}2. Therefore, detector cooling is not required, and this facilitates portability for measurements on-site (i.e., in the field and away from a laboratory). Spectral response was monitored using a scanning monochromator, and it was compared with that obtained by a portable spectrometer fitted with a linear charge-coupled device detector. To demonstrate detector responsivity, emission signals with an appreciable signal-to-noise ratio were obtained by introducing nanogram amounts of the sample into the microplasma.

Original languageEnglish (US)
Article number6399582
Pages (from-to)880-883
Number of pages4
JournalIEEE Transactions on Electron Devices
Issue number2
StatePublished - 2013
Externally publishedYes


  • Amorphous selenium (a-Se)
  • metal-semiconductor- metal detector
  • microplasma
  • ultraviolet (UV) detector

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering


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