@inproceedings{c28f997ded454e0aa337d3a5f1106e9a,
title = "Measurement of nanoscale deformations using fluorescent nanoparticles and digital image correlation",
abstract = "An optical method was devised to obtain full-field measurements of in-plane deformations at scales down to the nano- level using digital image correlation (DIG). Fluorescent nanoparticles (c.a. 160 nm in diameter) were spin-cast on the top surface of polydimethylsiloxane (PDMS) samples to provide a random speckle pattern required for DIC. Images were acquired under a compound fluorescent microscope, using a monochrome digital camera with a maximum spatial resolution of 134 nm/pixel, corresponding to a field of view measuring 171 μm × 137 μm. Correlations were performed on images taken from rigid body motion (translation and rotation) tests. Results show that rigid body translations as small as 20 nm (approximately 0.15 pixels) were found to be consistently measurable using this fluorescent DIC method. Rigid body rotations ranging from 0.48 to 300 arc-minutes (0.0080 to 5.0 degrees) were measured accurately to within 7.0%. This method has been applied to measure surface deformations in compliant polymers but can be extended for use with structures that necessitate non-contact nanoscale resolution such as ultra thin film coatings or certain biological materials.",
author = "Berfield, {T. A.} and Patel, {U. K.} and Sottos, {N. R.} and J. Lambros",
year = "2005",
language = "English (US)",
isbn = "0912053909",
series = "Proceedings of the 2005 SEM Annual Conference and Exposition on Experimental and Applied Mechanics",
pages = "313--316",
booktitle = "Proceedings of the 2005 SEM Annual Conference and Exposition on Experimental and Applied Mechanics",
note = "2005 SEM Annual Conference and Exposition on Experimental and Applied Mechanics ; Conference date: 07-06-2005 Through 09-06-2005",
}