Measurement of defect-mediated diffusion: The case of silicon self-diffusion

Ramakrishnan Vaidyanathan, Michael Y.L. Jung, Richard D. Braatz, E. G. Seebauer

Research output: Contribution to journalArticlepeer-review

Fingerprint

Dive into the research topics of 'Measurement of defect-mediated diffusion: The case of silicon self-diffusion'. Together they form a unique fingerprint.

Engineering & Materials Science

Earth & Environmental Sciences

Medicine & Life Sciences

Chemical Compounds