Measurement of adhesion force to determine surface composition in an electrochemical environment

Joseph M. Serafin, Andrew A. Gewirth

Research output: Contribution to journalArticlepeer-review

Abstract

Adhesion force measurements are used to determine potential dependence of the force of adhesion between a Si3N4 cantilever and an Au surface in basic solution. At both positive and negative potentials, the force curve is dominated by van der Waals contributions, indicating that there is little specific interaction between the tip and the sample. However, at intermediate potentials (between 0.4 and 0.6 V vs SHE) the tip - sample interaction is dominated by an adhesive component, the magnitude of which is approximately 2 kJ/mol; this corresponds to the expected strength of a hydrogen bond between O- groups on the tip and AuOH on the surface.

Original languageEnglish (US)
Pages (from-to)10833-10838
Number of pages6
JournalJournal of Physical Chemistry B
Volume101
Issue number50
DOIs
StatePublished - Dec 11 1997

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Surfaces, Coatings and Films
  • Materials Chemistry

Fingerprint

Dive into the research topics of 'Measurement of adhesion force to determine surface composition in an electrochemical environment'. Together they form a unique fingerprint.

Cite this