TY - GEN
T1 - Measurement-based analysis of fault and error sensitivities of dynamic memory
AU - Yim, Keun Soo
AU - Kalbarczyk, Zbigniew
AU - Iyer, Ravishankar K.
PY - 2010
Y1 - 2010
N2 - This paper presents a measurement-based analysis of the fault and error sensitivities of dynamic memory. We extend a software-implemented fault injector to support datatype-aware fault injection into dynamic memory. The results indicate that dynamic memory exhibits about 18 times higher fault sensitivity than static memory, mainly because of the higher activation rate. Furthermore, we show that errors in a large portion of static and dynamic memory space are recoverable by simple software techniques (e.g., reloading data from a disk). The recoverable data include pages filled with identical values (e.g., '0') and pages loaded from files unmodified during the computation. Consequently, the selection of targets for protection should be based on knowledge of recoverability rather than on error sensitivity alone.
AB - This paper presents a measurement-based analysis of the fault and error sensitivities of dynamic memory. We extend a software-implemented fault injector to support datatype-aware fault injection into dynamic memory. The results indicate that dynamic memory exhibits about 18 times higher fault sensitivity than static memory, mainly because of the higher activation rate. Furthermore, we show that errors in a large portion of static and dynamic memory space are recoverable by simple software techniques (e.g., reloading data from a disk). The recoverable data include pages filled with identical values (e.g., '0') and pages loaded from files unmodified during the computation. Consequently, the selection of targets for protection should be based on knowledge of recoverability rather than on error sensitivity alone.
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U2 - 10.1109/DSN.2010.5544287
DO - 10.1109/DSN.2010.5544287
M3 - Conference contribution
AN - SCOPUS:77956596497
SN - 9781424475018
T3 - Proceedings of the International Conference on Dependable Systems and Networks
SP - 431
EP - 436
BT - Proceedings of the 2010 IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2010
T2 - 2010 IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2010
Y2 - 28 June 2010 through 1 July 2010
ER -