Abstract
A new two-dimensional full-band Monte Carlo simulator, "Monte Carlo University of Texas" (MCUT) is introduced and described in this paper. MCUT combines some of the best features of semiclassical MC device simulation including full-band structure and flexibility of scattering processes, with generality of material composition and the ability to address degeneracy breaking among energy valleys and the associated effects on scattering and transport due to quantum confinement and strain effects. The latter capability derives for extension of a prior crystal-momentum-independent self-consistent Poisson-Schrödinger-based quantum corrected potential, to a valley dependent quantum correction via, in part, a new modeling concept of "effective strain" within the full-band structure code. Low field mobility simulation results for large tensile strained-Si channel nMOSFETs and unstrained-Si channel nMOSFETs device are compared with other simulation methods and experimental data to demonstrate the effectiveness of the approach, and the abilities to simulate high-field transport and transport in devices of a few 10s of nanometer channel lengths are briefly demonstrated.
Original language | English (US) |
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Pages (from-to) | 962-970 |
Number of pages | 9 |
Journal | IEEE Transactions on Electron Devices |
Volume | 51 |
Issue number | 6 |
DOIs | |
State | Published - Jun 1 2004 |
Keywords
- Full-band Monte Carlo (MC)
- MOSFET simulations
- Quantum effects
- SiGe heterostructures
- Strained-silicon
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering