Maximum a posteriori estimation of energetics in silicon self-diffusion

Charlotte T. Kwok, Kapil Dev, Edmund G. Seebauer, Richard D. Braatz

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Maximum A Posteriori (MAP) estimation was employed to refine estimates of various energetics in silicon self-diffusion. Self-diffusion profiles were augmented with prior parameter estimates determined from previous experimental systems to obtain improved values. Parameter sensitivity analysis was utilized before MAP estimation to determine the relative importance of model parameters. The sensitivities were a strong function of the surface boundary condition. For conditions with high surface loss flux, the energy for exchange between an interstitial and the lattice is the most critical. For conditions with a low surface loss flux, the dissociation energy of large-atom clusters plays a more important role. The incorporation of information from the new experimental system substantially improved the estimates of parameters that could not be identified accurately in previously studied systems.

Original languageEnglish (US)
Title of host publicationProceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05
Pages2058-2063
Number of pages6
DOIs
StatePublished - Dec 1 2005
Event44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05 - Seville, Spain
Duration: Dec 12 2005Dec 15 2005

Publication series

NameProceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05
Volume2005

Other

Other44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05
CountrySpain
CitySeville
Period12/12/0512/15/05

ASJC Scopus subject areas

  • Engineering(all)

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