Abstract
Mechanisms responsible for vertical cavity surface emitting laser degradation and failure were investigated using transmission electron microscopy and focussed ion beam sectioning techniques. It was found that the main cause of failure was the generation of complex dislocations dipole and loop arrays by non-radiative recombination enhanced mechanisms. Dislocations punched out due to oxide-induced strain or dislocations with origins in the substrate or surface appeared to act as nucleation sites for these complex arrays.
| Original language | English (US) |
|---|---|
| Pages | 437-438 |
| Number of pages | 2 |
| State | Published - Jan 1 2002 |
| Event | Conference on Lasers and Electro-Optics (CLEO 2002) - Long Beach, CA, United States Duration: May 19 2002 → May 24 2002 |
Other
| Other | Conference on Lasers and Electro-Optics (CLEO 2002) |
|---|---|
| Country | United States |
| City | Long Beach, CA |
| Period | 5/19/02 → 5/24/02 |
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ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Electrical and Electronic Engineering
Cite this
Mathes, D. T., Hull, R., Choquette, K. D., Geib, K. M., & Allerman, A. A. (2002). Materials analysis of degraded vertical cavity surface emitting lasers. 437-438. Paper presented at Conference on Lasers and Electro-Optics (CLEO 2002), Long Beach, CA, United States.