Materials analysis and particle probe: A compact diagnostic system for in situ analysis of plasma-facing components (invited)

C. N. Taylor, B. Heim, S. Gonderman, J. P. Allain, Z. Yang, R. Kaita, A. L. Roquemore, C. H. Skinner, R. A. Ellis

Research output: Contribution to journalArticle

Abstract

The objective of the materials analysis particle probe (MAPP) in NSTX is to enable prompt and direct analysis of plasma-facing components exposed to plasma discharges. MAPP allows multiple samples to be introduced to the level of the plasma-facing surface without breaking vacuum and analyzed using X-ray photoelectron spectroscopy (XPS), ion-scattering and direct recoil spectroscopy, and thermal desorption spectroscopy (TDS) immediately following the plasma discharge. MAPP is designed to operate as a diagnostic within the ∼12 min NSTX minimum between-shot time window to reveal fundamental plasma-surface interactions. Initial calibration demonstrates MAPPs XPS and TDS capabilities.

Original languageEnglish (US)
Article number10D703
JournalReview of Scientific Instruments
Volume83
Issue number10
DOIs
StatePublished - Oct 1 2012

ASJC Scopus subject areas

  • Instrumentation

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    Taylor, C. N., Heim, B., Gonderman, S., Allain, J. P., Yang, Z., Kaita, R., Roquemore, A. L., Skinner, C. H., & Ellis, R. A. (2012). Materials analysis and particle probe: A compact diagnostic system for in situ analysis of plasma-facing components (invited). Review of Scientific Instruments, 83(10), [10D703]. https://doi.org/10.1063/1.4729262