Materials analysis and particle probe: A compact diagnostic system for in situ analysis of plasma-facing components (invited)

C. N. Taylor, B. Heim, S. Gonderman, J. P. Allain, Z. Yang, R. Kaita, A. L. Roquemore, C. H. Skinner, R. A. Ellis

Research output: Contribution to journalArticle

Abstract

The objective of the materials analysis particle probe (MAPP) in NSTX is to enable prompt and direct analysis of plasma-facing components exposed to plasma discharges. MAPP allows multiple samples to be introduced to the level of the plasma-facing surface without breaking vacuum and analyzed using X-ray photoelectron spectroscopy (XPS), ion-scattering and direct recoil spectroscopy, and thermal desorption spectroscopy (TDS) immediately following the plasma discharge. MAPP is designed to operate as a diagnostic within the ∼12 min NSTX minimum between-shot time window to reveal fundamental plasma-surface interactions. Initial calibration demonstrates MAPPs XPS and TDS capabilities.

Original languageEnglish (US)
Article number10D703
JournalReview of Scientific Instruments
Volume83
Issue number10
DOIs
StatePublished - Oct 2012
Externally publishedYes

Fingerprint

probes
Plasmas
spectroscopy
plasma jets
desorption
photoelectron spectroscopy
Facings
Thermal desorption spectroscopy
X ray photoelectron spectroscopy
ion scattering
surface reactions
shot
vacuum
Beam plasma interactions
Spectroscopy
Calibration
Vacuum
Scattering
Ions

ASJC Scopus subject areas

  • Instrumentation

Cite this

Materials analysis and particle probe : A compact diagnostic system for in situ analysis of plasma-facing components (invited). / Taylor, C. N.; Heim, B.; Gonderman, S.; Allain, J. P.; Yang, Z.; Kaita, R.; Roquemore, A. L.; Skinner, C. H.; Ellis, R. A.

In: Review of Scientific Instruments, Vol. 83, No. 10, 10D703, 10.2012.

Research output: Contribution to journalArticle

Taylor, CN, Heim, B, Gonderman, S, Allain, JP, Yang, Z, Kaita, R, Roquemore, AL, Skinner, CH & Ellis, RA 2012, 'Materials analysis and particle probe: A compact diagnostic system for in situ analysis of plasma-facing components (invited)' Review of Scientific Instruments, vol 83, no. 10, 10D703. DOI: 10.1063/1.4729262

Taylor, C. N.; Heim, B.; Gonderman, S.; Allain, J. P.; Yang, Z.; Kaita, R.; Roquemore, A. L.; Skinner, C. H.; Ellis, R. A. / Materials analysis and particle probe : A compact diagnostic system for in situ analysis of plasma-facing components (invited).

In: Review of Scientific Instruments, Vol. 83, No. 10, 10D703, 10.2012.

Research output: Contribution to journalArticle

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