TY - JOUR
T1 - Mapping of new quantitative trait loci for sudden death syndrome and soybean cyst nematode resistance in two soybean populations
AU - Swaminathan, Sivakumar
AU - Abeysekara, Nilwala S.
AU - Knight, Joshua M.
AU - Liu, Min
AU - Dong, Jia
AU - Hudson, Matthew E.
AU - Bhattacharyya, Madan K.
AU - Cianzio, Silvia R.
N1 - Funding Information:
Acknowledgements This research was conducted by grants provided by the United Soybean Board (USB), National Institute of Food and Agriculture (NIFA), United States Department of Agriculture (Grant no. 2013-68004-20374) and the Iowa Soybean Association. We also thank Peter Lundeen, Alexander Luckew, Gregory Gebhart, and Kyle VanDer Molen for their assistance during the course of the work. We thank Dr. Perry Cregan for his assistance in conducting SNP mapping using the Illumina Golden Gate assay. We thank Dr. David Grant for kindly reviewing the manuscript.
Publisher Copyright:
© 2018, Springer-Verlag GmbH Germany, part of Springer Nature.
Copyright:
Copyright 2018 Elsevier B.V., All rights reserved.
PY - 2018/5/1
Y1 - 2018/5/1
N2 - Key message: Novel QTL conferring resistance to both the SDS and SCN was detected in two RIL populations. Dual resistant RILs could be used in breeding programs for developing resistant soybean cultivars. Abstract: Soybean cultivars, susceptible to the fungus Fusarium virguliforme, which causes sudden death syndrome (SDS), and to the soybean cyst nematode (SCN) (Heterodera glycines), suffer yield losses valued over a billion dollars annually. Both pathogens may occur in the same production fields. Planting of cultivars genetically resistant to both pathogens is considered one of the most effective means to control the two pathogens. The objective of the study was to map quantitative trait loci (QTL) underlying SDS and SCN resistances. Two recombinant inbred line (RIL) populations were developed by crossing ‘A95-684043’, a high-yielding maturity group (MG) II line resistant to SCN, with ‘LS94-3207’ and ‘LS98-0582’ of MG IV, resistant to both F. virguliforme and SCN. Two hundred F7 derived recombinant inbred lines from each population AX19286 (A95-684043 × LS94-3207) and AX19287 (A95-684043 × LS98-0582) were screened for resistance to each pathogen under greenhouse conditions. Five hundred and eighty and 371 SNP markers were used for mapping resistance QTL in each population. In AX19286, one novel SCN resistance QTL was mapped to chromosome 8. In AX19287, one novel SDS resistance QTL was mapped to chromosome 17 and one novel SCN resistance QTL was mapped to chromosome 11. Previously identified additional SDS and SCN resistance QTL were also detected in the study. Lines possessing superior resistance to both pathogens were also identified and could be used as germplasm sources for breeding SDS- and SCN-resistant soybean cultivars.
AB - Key message: Novel QTL conferring resistance to both the SDS and SCN was detected in two RIL populations. Dual resistant RILs could be used in breeding programs for developing resistant soybean cultivars. Abstract: Soybean cultivars, susceptible to the fungus Fusarium virguliforme, which causes sudden death syndrome (SDS), and to the soybean cyst nematode (SCN) (Heterodera glycines), suffer yield losses valued over a billion dollars annually. Both pathogens may occur in the same production fields. Planting of cultivars genetically resistant to both pathogens is considered one of the most effective means to control the two pathogens. The objective of the study was to map quantitative trait loci (QTL) underlying SDS and SCN resistances. Two recombinant inbred line (RIL) populations were developed by crossing ‘A95-684043’, a high-yielding maturity group (MG) II line resistant to SCN, with ‘LS94-3207’ and ‘LS98-0582’ of MG IV, resistant to both F. virguliforme and SCN. Two hundred F7 derived recombinant inbred lines from each population AX19286 (A95-684043 × LS94-3207) and AX19287 (A95-684043 × LS98-0582) were screened for resistance to each pathogen under greenhouse conditions. Five hundred and eighty and 371 SNP markers were used for mapping resistance QTL in each population. In AX19286, one novel SCN resistance QTL was mapped to chromosome 8. In AX19287, one novel SDS resistance QTL was mapped to chromosome 17 and one novel SCN resistance QTL was mapped to chromosome 11. Previously identified additional SDS and SCN resistance QTL were also detected in the study. Lines possessing superior resistance to both pathogens were also identified and could be used as germplasm sources for breeding SDS- and SCN-resistant soybean cultivars.
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U2 - 10.1007/s00122-018-3057-y
DO - 10.1007/s00122-018-3057-y
M3 - Article
C2 - 29582113
AN - SCOPUS:85044469233
SN - 0040-5752
VL - 131
SP - 1047
EP - 1062
JO - Theoretical and Applied Genetics
JF - Theoretical and Applied Genetics
IS - 5
ER -