TY - GEN
T1 - Manufacturability-aware physical layout optimizations
AU - Pan, David Z.
AU - Wong, Martin D.F.
PY - 2005
Y1 - 2005
N2 - Nanometer VLSI design is greatly challanged by the growing interdependency between manufacturing and design. Existing approaches in design for manufacturability (DFM) are still mostly post design, rather than during design. To really bridge the gap between design and manufacturing, it is important to model and feed proper manufacturing metrics and cost functions upstream, especially at the key physical layout optimization stages such as routing and placement, to have major impacts. In this paper, we show several aspects of the true manufactruability-aware physical design, from lithography-aware routing, to redundant-via aware routing, to CMP aware florplanning and placement, and show their promises.
AB - Nanometer VLSI design is greatly challanged by the growing interdependency between manufacturing and design. Existing approaches in design for manufacturability (DFM) are still mostly post design, rather than during design. To really bridge the gap between design and manufacturing, it is important to model and feed proper manufacturing metrics and cost functions upstream, especially at the key physical layout optimization stages such as routing and placement, to have major impacts. In this paper, we show several aspects of the true manufactruability-aware physical design, from lithography-aware routing, to redundant-via aware routing, to CMP aware florplanning and placement, and show their promises.
UR - http://www.scopus.com/inward/record.url?scp=25844507878&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=25844507878&partnerID=8YFLogxK
U2 - 10.1109/icicdt.2005.1502616
DO - 10.1109/icicdt.2005.1502616
M3 - Conference contribution
AN - SCOPUS:25844507878
SN - 0780390814
SN - 9780780390812
T3 - 2005 International Conference on Integrated Circuit Design and Technology, ICICDT
SP - 149
EP - 153
BT - 2005 International Conference on Integrated Circuit Design and Technology, ICICDT
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2005 International Conference on Integrated Circuit Design and Technology, ICICDT
Y2 - 9 May 2005 through 11 May 2005
ER -