Manifestation of faults to errors in signature analysis

John C. Chan; Baxter F. Womack; D. F. Wong

Manifestation of faults to errors in signature analysis

John C. Chan, Baxter F. Womack, D. F. Wong

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

The study of the relation between faults and its syndromes in signature analysis of computer hardware testing is presented. When an incorrect signature is observed, it is caused by one of many possible error sequences that contains errors at different locations. The characteristics of the error distributions are identified for greater fault coverage. Formal analysis is presented in conjunction with the subject of error-control code. The results provide insights to use deterministic test patterns in signature analysis.

Original language	English (US)
Title of host publication	IEEE International Conference on Computer Design - VLSI in Computers and Processors
Publisher	Publ by IEEE
Pages	360-363
Number of pages	4
ISBN (Print)	0818622709
State	Published - Dec 1 1991
Externally published	Yes
Event	Proceedings of the 1991 IEEE International Conference on Computer Design - VLSI in Computers and Processors - ICCD '91 - Cambridge, MA, USA Duration: Oct 14 1991 → Oct 16 1991

Publication series

Name	IEEE International Conference on Computer Design - VLSI in Computers and Processors

Other

Other	Proceedings of the 1991 IEEE International Conference on Computer Design - VLSI in Computers and Processors - ICCD '91
City	Cambridge, MA, USA
Period	10/14/91 → 10/16/91

ASJC Scopus subject areas

Hardware and Architecture
Electrical and Electronic Engineering

Access to Document

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Cite this

Manifestation of faults to errors in signature analysis. / Chan, John C.; Womack, Baxter F.; Wong, D. F.

IEEE International Conference on Computer Design - VLSI in Computers and Processors. Publ by IEEE, 1991. p. 360-363 (IEEE International Conference on Computer Design - VLSI in Computers and Processors).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Chan, JC, Womack, BF & Wong, DF 1991, Manifestation of faults to errors in signature analysis. in IEEE International Conference on Computer Design - VLSI in Computers and Processors. IEEE International Conference on Computer Design - VLSI in Computers and Processors, Publ by IEEE, pp. 360-363, Proceedings of the 1991 IEEE International Conference on Computer Design - VLSI in Computers and Processors - ICCD '91, Cambridge, MA, USA, 10/14/91.

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AB - The study of the relation between faults and its syndromes in signature analysis of computer hardware testing is presented. When an incorrect signature is observed, it is caused by one of many possible error sequences that contains errors at different locations. The characteristics of the error distributions are identified for greater fault coverage. Formal analysis is presented in conjunction with the subject of error-control code. The results provide insights to use deterministic test patterns in signature analysis.

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