@inproceedings{4eb180cc7143475f94d56fdd8e10ad76,
title = "Manifestation of faults to errors in signature analysis",
abstract = "The study of the relation between faults and its syndromes in signature analysis of computer hardware testing is presented. When an incorrect signature is observed, it is caused by one of many possible error sequences that contains errors at different locations. The characteristics of the error distributions are identified for greater fault coverage. Formal analysis is presented in conjunction with the subject of error-control code. The results provide insights to use deterministic test patterns in signature analysis.",
author = "Chan, {John C.} and Womack, {Baxter F.} and Wong, {D. F.}",
year = "1991",
language = "English (US)",
isbn = "0818622709",
series = "IEEE International Conference on Computer Design - VLSI in Computers and Processors",
publisher = "Publ by IEEE",
pages = "360--363",
booktitle = "IEEE International Conference on Computer Design - VLSI in Computers and Processors",
note = "Proceedings of the 1991 IEEE International Conference on Computer Design - VLSI in Computers and Processors - ICCD '91 ; Conference date: 14-10-1991 Through 16-10-1991",
}