Abstract
The study of the relation between faults and its syndromes in signature analysis of computer hardware testing is presented. When an incorrect signature is observed, it is caused by one of many possible error sequences that contains errors at different locations. The characteristics of the error distributions are identified for greater fault coverage. Formal analysis is presented in conjunction with the subject of error-control code. The results provide insights to use deterministic test patterns in signature analysis.
| Original language | English (US) |
|---|---|
| Title of host publication | IEEE International Conference on Computer Design - VLSI in Computers and Processors |
| Publisher | Publ by IEEE |
| Pages | 360-363 |
| Number of pages | 4 |
| ISBN (Print) | 0818622709 |
| State | Published - Dec 1 1991 |
| Externally published | Yes |
| Event | Proceedings of the 1991 IEEE International Conference on Computer Design - VLSI in Computers and Processors - ICCD '91 - Cambridge, MA, USA Duration: Oct 14 1991 → Oct 16 1991 |
Publication series
| Name | IEEE International Conference on Computer Design - VLSI in Computers and Processors |
|---|
Other
| Other | Proceedings of the 1991 IEEE International Conference on Computer Design - VLSI in Computers and Processors - ICCD '91 |
|---|---|
| City | Cambridge, MA, USA |
| Period | 10/14/91 → 10/16/91 |
Fingerprint
ASJC Scopus subject areas
- Hardware and Architecture
- Electrical and Electronic Engineering
Cite this
Manifestation of faults to errors in signature analysis. / Chan, John C.; Womack, Baxter F.; Wong, D. F.
IEEE International Conference on Computer Design - VLSI in Computers and Processors. Publ by IEEE, 1991. p. 360-363 (IEEE International Conference on Computer Design - VLSI in Computers and Processors).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - Manifestation of faults to errors in signature analysis
AU - Chan, John C.
AU - Womack, Baxter F.
AU - Wong, D. F.
PY - 1991/12/1
Y1 - 1991/12/1
N2 - The study of the relation between faults and its syndromes in signature analysis of computer hardware testing is presented. When an incorrect signature is observed, it is caused by one of many possible error sequences that contains errors at different locations. The characteristics of the error distributions are identified for greater fault coverage. Formal analysis is presented in conjunction with the subject of error-control code. The results provide insights to use deterministic test patterns in signature analysis.
AB - The study of the relation between faults and its syndromes in signature analysis of computer hardware testing is presented. When an incorrect signature is observed, it is caused by one of many possible error sequences that contains errors at different locations. The characteristics of the error distributions are identified for greater fault coverage. Formal analysis is presented in conjunction with the subject of error-control code. The results provide insights to use deterministic test patterns in signature analysis.
UR - http://www.scopus.com/inward/record.url?scp=0026294808&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0026294808&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:0026294808
SN - 0818622709
T3 - IEEE International Conference on Computer Design - VLSI in Computers and Processors
SP - 360
EP - 363
BT - IEEE International Conference on Computer Design - VLSI in Computers and Processors
PB - Publ by IEEE
ER -