Making high resolution positioning independent of scan rates: A feedback approach

Keyphrases

• Atomic Force Microscopy 100%
• High-resolution 100%
• Feedback Approach 100%
• Sub-nanometer Resolution 50%
• Ultra-high Resolution 50%
• Atomic Scale 50%
• Mica 50%
• Stick-slip 50%
• Central Frequency 50%
• Feedback Scheme 50%
• Bandpass Filter 50%
• Image Scanning 50%
• Repetitive Motion 50%
• Scanning Speed 50%
• Flexure-based 50%
• Low Bandwidth 50%
• Position Resolution 50%
• Scanning Frequency 50%

Engineering

• High Resolution 100%
• Scan Rate 100%
• Atomic Force Microscopy 66%
• Central Frequency 33%
• Feedback Scheme 33%
• Bandpass Filter 33%
• Flexure 33%
• Scan Speed 33%
• Stick-Slip 33%