Magnetic depth profile of a modulation-doped La1-x Cax MnO3 exchange-biased system

A. Hoffmann, S. J. May, S. G.E. Te Velthuis, S. Park, M. R. Fitzsimmons, G. Campillo, M. E. Gómez

Research output: Contribution to journalArticlepeer-review

Abstract

Recent magnetometry measurements in modulation-doped La1-x Cax MnO3 suggested that a net magnetization extends from the ferromagnetic layers into the adjacent antiferromagnet layers. Here we test this hypothesis by polarized neutron reflectometry, which allows us to determine the depth resolved magnetization profile. From fits to the reflectivity data we find that the additional magnetization does not occur at the ferromagnetic/antiferromagnetic interfaces, but rather in a thin region of the first antiferromagnetic layer adjacent to the interface with the substrate.

Original languageEnglish (US)
Article number052403
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume80
Issue number5
DOIs
StatePublished - Aug 17 2009
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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