Lower bounds on energy dissipation and noise-tolerance for deep submicron VLSI

Rajamohana Hegde, Naresh R Shanbhag

Research output: Contribution to journalArticlepeer-review

Abstract

In this paper, we obtain the lower bounds on total energy dissipation of deep submicron (DSM) VLSI circuits via an information-theoretic framework. This framework enables the derivation of lower bounds under the constraint of reliable operation in presence of DSM noise. We employ noise-tolerance via coding to approach the lower bounds on energy dissipation. It is shown that the lower bounds on energy for an off-chip I/O signaling example are a factor of 24X below present day systems. It is also shown that reduction in energy consumption by a factor of 4X can be obtained by employing Reed-Muller codes to achieve the desired bit-error-rate (BER) in presence of DSM noise.

Original languageEnglish (US)
JournalProceedings - IEEE International Symposium on Circuits and Systems
Volume6
StatePublished - 1999

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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