Low-temperature penetration depth of k-(ET)2 Cu[N(CN)2]Br and k-(ET)2 Cu(NCS)2

A. Carrington, I. J. Bonalde, R. Prozorov, R. W. Giannetta, A. M. Kini, J. Schlueter, H. H. Wang, U. Geiser, J. M. Williams

Research output: Contribution to journalArticle

Abstract

We present high-precision measurements of the penetration depth of single crystals of k-(ET)2 Cu[N(CN)2]Br and k-(ET)2 Cu(NCS)2at temperatures down to 0.4 K. We find that, at low temperatures, the in-plane penetration depth (λ||)varies as a fractional power law, λ|| ∼T3/2. While this may be taken as evidence for novel pair excitation processes, we show that the data are also consistent with a quasilinear variation of the superfluid density, as is expected for a d-wave superconductor with impurities or a small residual gap. Our data for the interplane penetration depth show similar features and give a direct measurement of the absolute value, λ⊥(0)=100 ±20 μm.

Original languageEnglish (US)
Pages (from-to)4172-4175
Number of pages4
JournalPhysical review letters
Volume83
Issue number20
DOIs
StatePublished - Jan 1 1999

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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    Carrington, A., Bonalde, I. J., Prozorov, R., Giannetta, R. W., Kini, A. M., Schlueter, J., Wang, H. H., Geiser, U., & Williams, J. M. (1999). Low-temperature penetration depth of k-(ET)2 Cu[N(CN)2]Br and k-(ET)2 Cu(NCS)2. Physical review letters, 83(20), 4172-4175. https://doi.org/10.1103/PhysRevLett.83.4172