Low-stress, coolable sample mount for ultrahigh vacuum studies of fragile semiconductors

K. A. Schultz; E. G. Seebauer

doi:10.1063/1.1142960

Low-stress, coolable sample mount for ultrahigh vacuum studies of fragile semiconductors

K. A. Schultz, E. G. Seebauer

Chemical and Biomolecular Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

A sample mount is described that is particularly useful for cooling and uniformly heating thin, fragile semiconductor samples in ultrahigh vacuum while maintaining optical flatness. The design is based on spring-loaded clips and permits rapid sample exchange. Difficulties with certain conventional methods of temperature measurement are avoided.

Original language	English (US)
Pages (from-to)	218-219
Number of pages	2
Journal	Review of Scientific Instruments
Volume	63
Issue number	1
DOIs	https://doi.org/10.1063/1.1142960
State	Published - 1992

ASJC Scopus subject areas

Instrumentation

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10.1063/1.1142960

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abstract = "A sample mount is described that is particularly useful for cooling and uniformly heating thin, fragile semiconductor samples in ultrahigh vacuum while maintaining optical flatness. The design is based on spring-loaded clips and permits rapid sample exchange. Difficulties with certain conventional methods of temperature measurement are avoided.",

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Low-stress, coolable sample mount for ultrahigh vacuum studies of fragile semiconductors

Abstract

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