Low-stress, coolable sample mount for ultrahigh vacuum studies of fragile semiconductors

K. A. Schultz, E. G. Seebauer

Research output: Contribution to journalArticlepeer-review

Abstract

A sample mount is described that is particularly useful for cooling and uniformly heating thin, fragile semiconductor samples in ultrahigh vacuum while maintaining optical flatness. The design is based on spring-loaded clips and permits rapid sample exchange. Difficulties with certain conventional methods of temperature measurement are avoided.

Original languageEnglish (US)
Pages (from-to)218-219
Number of pages2
JournalReview of Scientific Instruments
Volume63
Issue number1
DOIs
StatePublished - 1992

ASJC Scopus subject areas

  • Instrumentation

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