Low-frequency noise and discrete charge trapping in small-area tunnel junction dc SQUID's

R. T. Wakai, D. J. Van Harlingen

Research output: Contribution to journalArticlepeer-review

Abstract

We present measurements of the noise properties of very small-area, high current density tunnel junction dc superconducting quantum interference devices (SQUID's). The low-frequency noise spectra display broad curves and bumps consistent with the presence of individual Lorentzian features superimposed on a background which is always much flatter than 1/f. When these features are most prominent, the voltage across the SQUID exhibits discrete switching behavior which we attribute to the trapping and untrapping of single electrons within the tunneling barrier. This observation, along with other evidence presented, suggests that critical current fluctuations displaying tunneling kinetics dominate the low-frequency noise of these ultrasmall devices.

Original languageEnglish (US)
Pages (from-to)593-595
Number of pages3
JournalApplied Physics Letters
Volume49
Issue number10
DOIs
StatePublished - 1986

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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