Low-cost electroluminescence imaging for automated defect characterization in photovoltaic modules

Michael Bazzoli, Timothy J. Silverman, Lynford L. Goddard

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Electroluminescence (EL) i maging i safas t, well-established, laboratory c haracterization te chnique for photovoltaic (PV) mod ules th at ty pically requires e xpensive equipment. H ere, we p resent a n ovel 1 ow-cost extensible EL imaging technique that utilizes a mod ifled camera and auxiliary hardware to automate EL imaging of field-deployed PV modules.

Original languageEnglish (US)
Title of host publication30th Annual Conference of the IEEE Photonics Society, IPC 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages481-482
Number of pages2
ISBN (Electronic)9781509065783
DOIs
StatePublished - Nov 20 2017
Event30th Annual Conference of the IEEE Photonics Society, IPC 2017 - Lake Buena Vista, United States
Duration: Oct 1 2017Oct 5 2017

Publication series

Name30th Annual Conference of the IEEE Photonics Society, IPC 2017
Volume2017-January

Other

Other30th Annual Conference of the IEEE Photonics Society, IPC 2017
CountryUnited States
CityLake Buena Vista
Period10/1/1710/5/17

Fingerprint

Electroluminescence
electroluminescence
modules
Imaging techniques
Defects
defects
Costs
imaging techniques
hardware
Cameras
cameras
costs
Hardware

Keywords

  • Electroluminescence imaging
  • Photovoltaic module defect characterization

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Computer Networks and Communications
  • Instrumentation

Cite this

Bazzoli, M., Silverman, T. J., & Goddard, L. L. (2017). Low-cost electroluminescence imaging for automated defect characterization in photovoltaic modules. In 30th Annual Conference of the IEEE Photonics Society, IPC 2017 (pp. 481-482). (30th Annual Conference of the IEEE Photonics Society, IPC 2017; Vol. 2017-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IPCon.2017.8116193

Low-cost electroluminescence imaging for automated defect characterization in photovoltaic modules. / Bazzoli, Michael; Silverman, Timothy J.; Goddard, Lynford L.

30th Annual Conference of the IEEE Photonics Society, IPC 2017. Institute of Electrical and Electronics Engineers Inc., 2017. p. 481-482 (30th Annual Conference of the IEEE Photonics Society, IPC 2017; Vol. 2017-January).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Bazzoli, M, Silverman, TJ & Goddard, LL 2017, Low-cost electroluminescence imaging for automated defect characterization in photovoltaic modules. in 30th Annual Conference of the IEEE Photonics Society, IPC 2017. 30th Annual Conference of the IEEE Photonics Society, IPC 2017, vol. 2017-January, Institute of Electrical and Electronics Engineers Inc., pp. 481-482, 30th Annual Conference of the IEEE Photonics Society, IPC 2017, Lake Buena Vista, United States, 10/1/17. https://doi.org/10.1109/IPCon.2017.8116193
Bazzoli M, Silverman TJ, Goddard LL. Low-cost electroluminescence imaging for automated defect characterization in photovoltaic modules. In 30th Annual Conference of the IEEE Photonics Society, IPC 2017. Institute of Electrical and Electronics Engineers Inc. 2017. p. 481-482. (30th Annual Conference of the IEEE Photonics Society, IPC 2017). https://doi.org/10.1109/IPCon.2017.8116193
Bazzoli, Michael ; Silverman, Timothy J. ; Goddard, Lynford L. / Low-cost electroluminescence imaging for automated defect characterization in photovoltaic modules. 30th Annual Conference of the IEEE Photonics Society, IPC 2017. Institute of Electrical and Electronics Engineers Inc., 2017. pp. 481-482 (30th Annual Conference of the IEEE Photonics Society, IPC 2017).
@inproceedings{e8c1c950a6e6470183c9a4fae69f7cbf,
title = "Low-cost electroluminescence imaging for automated defect characterization in photovoltaic modules",
abstract = "Electroluminescence (EL) i maging i safas t, well-established, laboratory c haracterization te chnique for photovoltaic (PV) mod ules th at ty pically requires e xpensive equipment. H ere, we p resent a n ovel 1 ow-cost extensible EL imaging technique that utilizes a mod ifled camera and auxiliary hardware to automate EL imaging of field-deployed PV modules.",
keywords = "Electroluminescence imaging, Photovoltaic module defect characterization",
author = "Michael Bazzoli and Silverman, {Timothy J.} and Goddard, {Lynford L.}",
year = "2017",
month = "11",
day = "20",
doi = "10.1109/IPCon.2017.8116193",
language = "English (US)",
series = "30th Annual Conference of the IEEE Photonics Society, IPC 2017",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "481--482",
booktitle = "30th Annual Conference of the IEEE Photonics Society, IPC 2017",
address = "United States",

}

TY - GEN

T1 - Low-cost electroluminescence imaging for automated defect characterization in photovoltaic modules

AU - Bazzoli, Michael

AU - Silverman, Timothy J.

AU - Goddard, Lynford L.

PY - 2017/11/20

Y1 - 2017/11/20

N2 - Electroluminescence (EL) i maging i safas t, well-established, laboratory c haracterization te chnique for photovoltaic (PV) mod ules th at ty pically requires e xpensive equipment. H ere, we p resent a n ovel 1 ow-cost extensible EL imaging technique that utilizes a mod ifled camera and auxiliary hardware to automate EL imaging of field-deployed PV modules.

AB - Electroluminescence (EL) i maging i safas t, well-established, laboratory c haracterization te chnique for photovoltaic (PV) mod ules th at ty pically requires e xpensive equipment. H ere, we p resent a n ovel 1 ow-cost extensible EL imaging technique that utilizes a mod ifled camera and auxiliary hardware to automate EL imaging of field-deployed PV modules.

KW - Electroluminescence imaging

KW - Photovoltaic module defect characterization

UR - http://www.scopus.com/inward/record.url?scp=85043371947&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85043371947&partnerID=8YFLogxK

U2 - 10.1109/IPCon.2017.8116193

DO - 10.1109/IPCon.2017.8116193

M3 - Conference contribution

AN - SCOPUS:85043371947

T3 - 30th Annual Conference of the IEEE Photonics Society, IPC 2017

SP - 481

EP - 482

BT - 30th Annual Conference of the IEEE Photonics Society, IPC 2017

PB - Institute of Electrical and Electronics Engineers Inc.

ER -