Low-cost electroluminescence imaging for automated defect characterization in photovoltaic modules

Michael Bazzoli; Timothy J. Silverman; Lynford L. Goddard

doi:10.1109/IPCon.2017.8116193

Low-cost electroluminescence imaging for automated defect characterization in photovoltaic modules

Michael Bazzoli, Timothy J. Silverman, Lynford L. Goddard

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Electroluminescence (EL) i maging i safas t, well-established, laboratory c haracterization te chnique for photovoltaic (PV) mod ules th at ty pically requires e xpensive equipment. H ere, we p resent a n ovel 1 ow-cost extensible EL imaging technique that utilizes a mod ifled camera and auxiliary hardware to automate EL imaging of field-deployed PV modules.

Original language	English (US)
Title of host publication	30th Annual Conference of the IEEE Photonics Society, IPC 2017
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	481-482
Number of pages	2
ISBN (Electronic)	9781509065783
DOIs	https://doi.org/10.1109/IPCon.2017.8116193
State	Published - Nov 20 2017
Event	30th Annual Conference of the IEEE Photonics Society, IPC 2017 - Lake Buena Vista, United States Duration: Oct 1 2017 → Oct 5 2017

Publication series

Name	30th Annual Conference of the IEEE Photonics Society, IPC 2017
Volume	2017-January

Other

Other	30th Annual Conference of the IEEE Photonics Society, IPC 2017
Country/Territory	United States
City	Lake Buena Vista
Period	10/1/17 → 10/5/17

Keywords

Electroluminescence imaging
Photovoltaic module defect characterization

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics
Computer Networks and Communications
Instrumentation

Online availability

10.1109/IPCon.2017.8116193

Library availability

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Bazzoli, M., Silverman, T. J., & Goddard, L. L. (2017). Low-cost electroluminescence imaging for automated defect characterization in photovoltaic modules. In 30th Annual Conference of the IEEE Photonics Society, IPC 2017 (pp. 481-482). (30th Annual Conference of the IEEE Photonics Society, IPC 2017; Vol. 2017-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IPCon.2017.8116193

Low-cost electroluminescence imaging for automated defect characterization in photovoltaic modules. / Bazzoli, Michael; Silverman, Timothy J.; Goddard, Lynford L.
30th Annual Conference of the IEEE Photonics Society, IPC 2017. Institute of Electrical and Electronics Engineers Inc., 2017. p. 481-482 (30th Annual Conference of the IEEE Photonics Society, IPC 2017; Vol. 2017-January).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Bazzoli, M, Silverman, TJ & Goddard, LL 2017, Low-cost electroluminescence imaging for automated defect characterization in photovoltaic modules. in 30th Annual Conference of the IEEE Photonics Society, IPC 2017. 30th Annual Conference of the IEEE Photonics Society, IPC 2017, vol. 2017-January, Institute of Electrical and Electronics Engineers Inc., pp. 481-482, 30th Annual Conference of the IEEE Photonics Society, IPC 2017, Lake Buena Vista, United States, 10/1/17. https://doi.org/10.1109/IPCon.2017.8116193

Bazzoli M, Silverman TJ, Goddard LL. Low-cost electroluminescence imaging for automated defect characterization in photovoltaic modules. In 30th Annual Conference of the IEEE Photonics Society, IPC 2017. Institute of Electrical and Electronics Engineers Inc. 2017. p. 481-482. (30th Annual Conference of the IEEE Photonics Society, IPC 2017). doi: 10.1109/IPCon.2017.8116193

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Low-cost electroluminescence imaging for automated defect characterization in photovoltaic modules

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