Low-cost electroluminescence imaging for automated defect characterization in photovoltaic modules

Michael Bazzoli, Timothy J. Silverman, Lynford L. Goddard

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Electroluminescence (EL) i maging i safas t, well-established, laboratory c haracterization te chnique for photovoltaic (PV) mod ules th at ty pically requires e xpensive equipment. H ere, we p resent a n ovel 1 ow-cost extensible EL imaging technique that utilizes a mod ifled camera and auxiliary hardware to automate EL imaging of field-deployed PV modules.

Original languageEnglish (US)
Title of host publication30th Annual Conference of the IEEE Photonics Society, IPC 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages481-482
Number of pages2
ISBN (Electronic)9781509065783
DOIs
StatePublished - Nov 20 2017
Event30th Annual Conference of the IEEE Photonics Society, IPC 2017 - Lake Buena Vista, United States
Duration: Oct 1 2017Oct 5 2017

Publication series

Name30th Annual Conference of the IEEE Photonics Society, IPC 2017
Volume2017-January

Other

Other30th Annual Conference of the IEEE Photonics Society, IPC 2017
CountryUnited States
CityLake Buena Vista
Period10/1/1710/5/17

Keywords

  • Electroluminescence imaging
  • Photovoltaic module defect characterization

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Computer Networks and Communications
  • Instrumentation

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