Loss and the accuracy of the photonic crystal model in holey VCSELs

Aaron J. Danner, James J. Raftery, Paul O. Leisher, Erin A. Yamaoka, Sonia R. Lala, Michael L. Hwang, Kent D Choquette

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A comprehensive parametric study of VCSELs incorporating etched holes for lateral confinement was conducted. Results from over two thousand devices reveal the role of loss and verify the predictive abilities of the photonic crystal model.

Original languageEnglish (US)
Title of host publicationConference on Lasers and Electro-Optics, CLEO 2005
PublisherOptical Society of America
ISBN (Print)1557527709, 9781557527707
StatePublished - 2005
EventConference on Lasers and Electro-Optics, CLEO 2005 - Baltimore, MD, United States
Duration: May 22 2005May 22 2005

Other

OtherConference on Lasers and Electro-Optics, CLEO 2005
Country/TerritoryUnited States
CityBaltimore, MD
Period5/22/055/22/05

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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