Loss and the accuracy of the photonic crystal model in holey VCSELs

Aaron J. Danner, James J. Raftery, Paul O. Leisher, Erin A. Yamaoka, Sonia R. Lala, Michael L. Hwang, Kent D. Choquette

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A comprehensive parametric study of VCSELs incorporating etched holes for lateral confinement was conducted. Results from over two thousand devices reveal the role of loss and verify the predictive abilities of the photonic crystal model.

Original languageEnglish (US)
Title of host publication2005 Conference on Lasers and Electro-Optics, CLEO
Pages1927-1928
Number of pages2
StatePublished - Dec 1 2005
Event2005 Conference on Lasers and Electro-Optics, CLEO - Baltimore, MD, United States
Duration: May 22 2005May 27 2005

Publication series

Name2005 Conference on Lasers and Electro-Optics, CLEO
Volume3

Other

Other2005 Conference on Lasers and Electro-Optics, CLEO
CountryUnited States
CityBaltimore, MD
Period5/22/055/27/05

ASJC Scopus subject areas

  • Engineering(all)

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