@inproceedings{1246e7354abf446aa01da15187ac196f,
title = "Locally optimal detection of adversarial inputs to image classifiers",
abstract = "Deep neural networks achieve state-of-the-art performance for image classification and other tasks but are easily fooled by forgeries which slightly modify a legitimate image in a specific direction and are visually indistinguishable from the original. This presents a security risk for applications such as driverless transportation systems. We formulate detection of such forgeries as a watermark detection problem and derive locally optimal statistical tests for identifying them. Motivated by this optimal structure, we present a procedure for learning a forgery detector from a training set. The reliability of our forgery detector is assessed for several image classification tasks.",
author = "Pierre Moulin and Amish Goel",
year = "2017",
month = sep,
day = "5",
doi = "10.1109/ICMEW.2017.8026257",
language = "English (US)",
series = "2017 IEEE International Conference on Multimedia and Expo Workshops, ICMEW 2017",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "459--464",
booktitle = "2017 IEEE International Conference on Multimedia and Expo Workshops, ICMEW 2017",
address = "United States",
note = "2017 IEEE International Conference on Multimedia and Expo Workshops, ICMEW 2017 ; Conference date: 10-07-2017 Through 14-07-2017",
}