A new imaging architecture with linear current mode active pixel sensor (APS) is presented. Focal plane image processing in the current domain includes correlated double sampling (CDS) unit for fixed pattern noise (FPN) suppression. The CDS unit is composed of first generation current conveyer circuit and class AB cascaded current memory cell. Measured FPN of 0.9% from saturation level is achieved with the CDS unit compared to 1.9% FPN from current mode images without noise suppression circuitry. A 40 by 40 imaging array was fabricated in a standard 0.5μm process and its functionality was successfully tested. Theoretical analysis for second order non-linear effects is also presented.
|Original language||English (US)|
|Journal||Proceedings - IEEE International Symposium on Circuits and Systems|
|State||Published - Sep 6 2004|
|Event||2004 IEEE International Symposium on Cirquits and Systems - Proceedings - Vancouver, BC, Canada|
Duration: May 23 2004 → May 26 2004
ASJC Scopus subject areas
- Electrical and Electronic Engineering