Linear current mode imager with low fix pattern noise

Viktor Gruev, Ralph Etienne-Cummings, Timmer Horiuchf

Research output: Contribution to journalConference articlepeer-review


A new imaging architecture with linear current mode active pixel sensor (APS) is presented. Focal plane image processing in the current domain includes correlated double sampling (CDS) unit for fixed pattern noise (FPN) suppression. The CDS unit is composed of first generation current conveyer circuit and class AB cascaded current memory cell. Measured FPN of 0.9% from saturation level is achieved with the CDS unit compared to 1.9% FPN from current mode images without noise suppression circuitry. A 40 by 40 imaging array was fabricated in a standard 0.5μm process and its functionality was successfully tested. Theoretical analysis for second order non-linear effects is also presented.

Original languageEnglish (US)
Pages (from-to)IV-860-IV-863
JournalProceedings - IEEE International Symposium on Circuits and Systems
StatePublished - 2004
Externally publishedYes
Event2004 IEEE International Symposium on Cirquits and Systems - Proceedings - Vancouver, BC, Canada
Duration: May 23 2004May 26 2004

ASJC Scopus subject areas

  • Electrical and Electronic Engineering


Dive into the research topics of 'Linear current mode imager with low fix pattern noise'. Together they form a unique fingerprint.

Cite this