Linear current-mode active pixel sensor

Ralf M. Philipp, David Orr, Viktor Gruev, Jan Van Der Spiegel, Ralph Etienne-Cummings

Research output: Contribution to journalArticlepeer-review

Abstract

A current mode CMOS active pixel sensor (APS) providing linear light-to-current conversion with inherently low fixed pattern noise (FPN) is presented. The pixel features adjustable-gain current output using a pMOS readout transistor in the linear region of operation. This paper discusses the pixel's design and operation, and presents an analysis of the pixel's temporal noise and FPN. Results for zero and first-order pixel mismatch are presented. The pixel was implemented in a both a 3.3 V 0.35 μm and a 1.8 V 0.18 μm CMOS process. The 0.35 μm process pixel had an uncorrected FPN of 1.4%/0.7% with/without column readout mismatch. The 0.18 μm process pixel had 0.4% FPN after delta-reset sampling (DRS). The pixel size in both processes was 10 × 10 μm2, with fill factors of 26% and 66%, respectively.

Original languageEnglish (US)
Article number4362109
Pages (from-to)2482-2491
Number of pages10
JournalIEEE Journal of Solid-State Circuits
Volume42
Issue number11
DOIs
StatePublished - Nov 2007
Externally publishedYes

Keywords

  • CMOS analog integrated circuits
  • image sensors

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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