Length scale effects on deformation and failure mechanisms of ultra-fine grained aluminum

K. Hattar, J. H. Han, D. M. Follstaedt, S. J. Hearne, M Taher A Saif, I. M. Rohertson

Research output: Chapter in Book/Report/Conference proceedingConference contribution


The deformation and failure processes in ultra-fine grained aluminum over different length scales have been probed using transmission electron microscopy (TEM) and scanning electron microscopy (SEM) in combination with a micromechanical in situ straining device. This novel straining device affords the opportunity to correlate directly the macroscopic mechanical properties with the microscopic deformation and failure mechanisms. Through use of this device it has been shown that increased film thickness results in a transition between limited plasticity and intergranular fracture to global plasticity and shear failure for deposited aluminum samples of similar grain size but different thickness.

Original languageEnglish (US)
Title of host publicationIn Situ Electron Microscopy of Materials
Number of pages6
StatePublished - 2005
Event2005 MRS Fall Meeting - Boston, MA, United States
Duration: Nov 28 2005Dec 2 2005

Publication series

NameMaterials Research Society Symposium Proceedings
ISSN (Print)0272-9172


Other2005 MRS Fall Meeting
Country/TerritoryUnited States
CityBoston, MA

ASJC Scopus subject areas

  • General Materials Science
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering


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