@inproceedings{fc3c5db78ad3471a86b964f8b29dbc41,
title = "Length scale effects on deformation and failure mechanisms of ultra-fine grained aluminum",
abstract = "The deformation and failure processes in ultra-fine grained aluminum over different length scales have been probed using transmission electron microscopy (TEM) and scanning electron microscopy (SEM) in combination with a micromechanical in situ straining device. This novel straining device affords the opportunity to correlate directly the macroscopic mechanical properties with the microscopic deformation and failure mechanisms. Through use of this device it has been shown that increased film thickness results in a transition between limited plasticity and intergranular fracture to global plasticity and shear failure for deposited aluminum samples of similar grain size but different thickness.",
author = "K. Hattar and Han, {J. H.} and Follstaedt, {D. M.} and Hearne, {S. J.} and Saif, {M Taher A} and Rohertson, {I. M.}",
year = "2005",
language = "English (US)",
isbn = "1558998624",
series = "Materials Research Society Symposium Proceedings",
pages = "1--6",
booktitle = "In Situ Electron Microscopy of Materials",
note = "2005 MRS Fall Meeting ; Conference date: 28-11-2005 Through 02-12-2005",
}