Leem investigations of BCC metals grown heteroepitaxially on sapphire

Keyphrases

• High Temperature 100%
• Low Energy Electron Microscopy 100%
• Sapphire 100%
• Slip Trace 100%
• Aluminum Oxide 50%
• Low Temperature 50%
• Dislocation 50%
• Surface Diffusion 50%
• Phase Diagram 50%
• Stepped Surfaces 50%
• Short-range Interaction 50%
• Diffraction 50%
• Displacement Field 50%
• Terraces 50%
• Misorientation 50%
• Step Edge 50%
• LEED® 50%
• Long-range Interactions 50%
• Metal Interfaces 50%
• Clean Surface 50%
• Stripe Phase 50%
• Electron Microscopy Images 50%
• Cottrell Atmosphere 50%
• Dislocation Slip 50%
• Surface Steps 50%
• Interfacial Dislocations 50%
• Surface Science 50%
• Surface Topography 50%
• Impurity Phase 50%
• Threading Edge Dislocation 50%
• Surface Reconstruction 50%
• Refractory Metals 50%
• Surface Impurities 50%
• Video Sequences 50%
• Almost Ideal 50%
• (110) Facet 50%
• Threading Screw Dislocation 50%
• Bulk Process 50%

Material Science

• Sapphire 100%
• Surface (Surface Science) 100%
• Low-Energy Electron Microscopy 66%
• Aluminum Oxide 33%
• Thin Films 33%
• Nucleation 33%
• Surface Diffusion 33%
• Metal Interface 33%
• Surface Science 33%
• Surface Reconstruction 33%
• Refractory Metal 33%
• Edge Dislocation 33%
• Screw Dislocation 33%
• Surface Topography 33%

Engineering

• Energy Electron 100%
• Low-Temperature 50%
• Thin Films 50%
• Displacement Field 50%
• Environmental Design 50%
• Surface Topography 50%
• Interfacial Dislocation 50%
• Flat Surface 50%
• Edge Dislocation 50%
• Screw Dislocation 50%