Abstract
On-chip L1 and L2 caches represent a sizeable fraction of the total power consumption of microprocessors. In deep sub-micron technology, the subthreshold leakage power is becoming the dominant fraction of the total power consumption of those caches. In this paper, we present optimization techniques to reduce the leakage power of on-chip caches assuming that there are multiple threshold voltages, VTH's, available. First, we show a cache leakage optimization technique that examines the trade-off between access time and leakage power by assigning distinct VTH's to each of the four main cache components - address bus drivers, data bus drivers, decoders, and SRAM cell arrays with sense-amps. Second, we show optimization techniques to reduce the leakage power of L1 and L2 on-chip caches without affecting the average memory access time. The key results are: 1) 2 VTH's are enough to minimize leakage in a single cache; 2) if L1 size is fixed, increasing the L2 size can result in much lower leakage without reducing average memory access time; 3) if L2 size is fixed, reducing L1 size can result in lower leakage without loss of the average memory access time; and 4) smaller L1 and larger L2 caches than are typical in today's processors result in significant leakage and dynamic power reduction without affecting the average memory access time.
Original language | English (US) |
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Pages (from-to) | 627-632 |
Number of pages | 6 |
Journal | IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers |
State | Published - 2003 |
Externally published | Yes |
Event | IEEE/ACM International Conference on Computer Aided Design ICCAD 2003: IEEE/ACM Digest of Technical Papers - San Jose, CA, United States Duration: Nov 9 2003 → Nov 13 2003 |
ASJC Scopus subject areas
- Software
- Computer Science Applications
- Computer Graphics and Computer-Aided Design