Layout sensitivities of transient external latchup

Arjun Kripanidhi, Elyse Rosenbaum

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The trigger current for external latchup depends on the duration of the triggering event. A physics-based model is provided to capture the effects of aggressor to victim spacing and orientation on transient triggering of external latchup. The latchup susceptibility of standard cell based designs is also investigated.

Original languageEnglish (US)
Title of host publication2012 IEEE International Reliability Physics Symposium, IRPS 2012
Pages3E.3.1-3E.3.6
DOIs
StatePublished - 2012
Event2012 IEEE International Reliability Physics Symposium, IRPS 2012 - Anaheim, CA, United States
Duration: Apr 15 2012Apr 19 2012

Publication series

NameIEEE International Reliability Physics Symposium Proceedings
ISSN (Print)1541-7026

Other

Other2012 IEEE International Reliability Physics Symposium, IRPS 2012
Country/TerritoryUnited States
CityAnaheim, CA
Period4/15/124/19/12

Keywords

  • Latchup
  • PNPN
  • Transient External Latchup

ASJC Scopus subject areas

  • General Engineering

Fingerprint

Dive into the research topics of 'Layout sensitivities of transient external latchup'. Together they form a unique fingerprint.

Cite this