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Layer disordering of n-type (Se) and p-type (C) Al
x
Ga
1-x
As-GaAs superlattices by S diffusion
J. S. Major
,
J. M. Dallesasse
, L. J. Guido
, J. E. Baker
, W. E. Plano
, A. R. Sugg
, E. J. Vesely
, T. A. Richard
, N. Holonyak
Grainger College of Engineering
Electrical and Computer Engineering
Micro and Nanotechnology Lab
Research output
:
Contribution to journal
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›
peer-review
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Dive into the research topics of 'Layer disordering of n-type (Se) and p-type (C) Al
x
Ga
1-x
As-GaAs superlattices by S diffusion'. Together they form a unique fingerprint.
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Keyphrases
Absorption Measurement
50%
AlxGa1-xN
50%
C-doped
50%
Cross Section Measurement
50%
Defect Vacancy
50%
Diffusion Depth
50%
Gallium Arsenide
100%
Minimal Displacement Vector
50%
Native Defects
50%
P-type
100%
Se-doped
50%
Secondary Ion Mass Spectrometry
50%
Shallow Angles
50%
Superlattices
100%
V(III)
50%
Material Science
Gallium Arsenide
100%
Secondary Ion Mass Spectrometry
50%
Superlattice
100%
Vacancy Defect
50%
Chemistry
Crystal Vacancy
50%
Secondary Ion Mass Spectroscopy
50%
Superlattice
100%