Abstract
Here we report a technique for transferring graphene layers, one by one, from a multilayer deposit formed by epitaxial growth on the Si-terminated face of a 6H-SiC substrate. The procedure uses a bilayer film of palladium/polyimide deposited onto the graphene coated SiC, which is then mechanically peeled away and placed on a target substrate. Orthogonal etching of the palladium and polyimide leaves isolated sheets of graphene with sizes of square centimeters. Repeating these steps transfers additional sheets from the same SiC substrate. Raman spectroscopy, scanning tunneling spectroscopy, low-energy electron diffraction and X-ray photoelectron spectroscopy, together with scanning tunneling, atomic force, optical, and scanning electron microscopy reveal key properties of the materials. The sheet resistances determined from measurements of four point probe devices were found to be ∼2 kΣ/square, close to expectation. Graphene crossbar structures fabricated in stacked configurations demonstrate the versatility of the procedures.
Original language | English (US) |
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Pages (from-to) | 5591-5598 |
Number of pages | 8 |
Journal | ACS Nano |
Volume | 4 |
Issue number | 10 |
DOIs | |
State | Published - Oct 26 2010 |
Keywords
- epitaxial growth
- four-point measurement
- graphene
- layer-by-layer
- silicon carbide
- transfer technique
ASJC Scopus subject areas
- General Engineering
- General Materials Science
- General Physics and Astronomy