Abstract
Process scaling in modern integrated circuits has led to multiple signal and power integrity issues. In particular, ensuring reliable performance of on-chip power delivery systems has become a major design challenge. Rigorous analysis and simulations are required at the design stage to ensure proper functionality of an on-chip power supply. This puts a strain on existing numerical tools due to the sheer size of the power grids. In this paper, a fast circuit simulation technique based on the latency insertion method (LIM) is proposed for the steady-state analysis of large-scale circuits, such as on-chip power distribution network. The proposed method is shown to be very efficient for modeling of networks with very large numbers of nodes. The comparison with one of the well-established methods used for the power grid analysis today, the Random-Walk algorithm, shows that LIM is almost two orders of magnitude faster.
Original language | English (US) |
---|---|
Article number | 6009178 |
Pages (from-to) | 1839-1845 |
Number of pages | 7 |
Journal | IEEE Transactions on Components, Packaging and Manufacturing Technology |
Volume | 1 |
Issue number | 11 |
DOIs | |
State | Published - Nov 2011 |
Keywords
- DC analysis
- IR-drop
- latency insertion
- latency insertion method
- power distribution network
- power integrity
- power supply
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Industrial and Manufacturing Engineering
- Electrical and Electronic Engineering