Latch-up model of non-collinear PNPN structures

Collin Reiman, Nathan Jack, Elyse Rosenbaum

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A scalable I-V model for latch-up in non-collinear PNPN devices is adapted from a previous model for collinear SCR devices. The model is applied to 14-nm FinFET test structures. Layout scaling trends for key latch-up metrics, such as holding and trigger voltage, are captured by the model in circuit simulation. TCAD simulation is used to gain physical insight into the behavior of non-collinear PNPN devices.

Original languageEnglish (US)
Title of host publicationElectrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2018
PublisherESD Association
Volume2018-September
ISBN (Electronic)1585373028
StatePublished - Oct 25 2018
Event40th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2018 - Reno, United States
Duration: Sep 23 2018Sep 28 2018

Other

Other40th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2018
CountryUnited States
CityReno
Period9/23/189/28/18

Fingerprint

Circuit simulation
Thyristors
Electric potential
FinFET

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Reiman, C., Jack, N., & Rosenbaum, E. (2018). Latch-up model of non-collinear PNPN structures. In Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2018 (Vol. 2018-September). ESD Association.

Latch-up model of non-collinear PNPN structures. / Reiman, Collin; Jack, Nathan; Rosenbaum, Elyse.

Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2018. Vol. 2018-September ESD Association, 2018.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Reiman, C, Jack, N & Rosenbaum, E 2018, Latch-up model of non-collinear PNPN structures. in Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2018. vol. 2018-September, ESD Association, 40th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2018, Reno, United States, 9/23/18.
Reiman C, Jack N, Rosenbaum E. Latch-up model of non-collinear PNPN structures. In Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2018. Vol. 2018-September. ESD Association. 2018
Reiman, Collin ; Jack, Nathan ; Rosenbaum, Elyse. / Latch-up model of non-collinear PNPN structures. Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2018. Vol. 2018-September ESD Association, 2018.
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