Large system test data analysis

This paper studies black-box testing and verification of large systems. Testing data is collected from several test beams. A flat, integrated database of test, fault, repair, and source file information is built. A new analysis methodology based on the black-box test design and white-box analysis is proposed. The methodology is intended to reduce testing costs and enhance software quality by improving test selection, eliminating test redundancy, and identifying error-prone source files. Using example data from AT&T systems, the improved analysis methodology is demonstrated.