Large system test data analysis

Kent C. Clapp, Ravishankar K. Iyer

Research output: Contribution to journalArticlepeer-review


This paper studies black-box testing and verification of large systems. Testing data is collected from several test beams. A flat, integrated database of test, fault, repair, and source file information is built. A new analysis methodology based on the black-box test design and white-box analysis is proposed. The methodology is intended to reduce testing costs and enhance software quality by improving test selection, eliminating test redundancy, and identifying error-prone source files. Using example data from AT&T systems, the improved analysis methodology is demonstrated.

Original languageEnglish (US)
Pages (from-to)122-133
Number of pages12
JournalComputer Systems Science and Engineering
Issue number2
StatePublished - Apr 1994
Externally publishedYes

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Theoretical Computer Science
  • General Computer Science


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