Abstract
Wafer-scale nano-mushroom sensor was demonstrated with the refractive index sensitivity of 373 nm/RIU, resulting in significant color shift detectable by eye. It also works for surface-enhanced Raman spectroscopy with the enhancement factor of 107.
| Original language | English (US) |
|---|---|
| State | Published - 2014 |
| Externally published | Yes |
| Event | 2014 Conference on Lasers and Electro-Optics, CLEO 2014 - San Jose, United States Duration: Jun 8 2014 → Jun 13 2014 |
Other
| Other | 2014 Conference on Lasers and Electro-Optics, CLEO 2014 |
|---|---|
| Country/Territory | United States |
| City | San Jose |
| Period | 6/8/14 → 6/13/14 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Atomic and Molecular Physics, and Optics
- Electronic, Optical and Magnetic Materials