K-edge imaging using dual-layer and single-layer large area flat panel imagers

Nicholas Allec, Shiva Abbaszadeh, Andre Fleck, Olivier Tousignant, Karim S. Karim

Research output: Contribution to journalArticlepeer-review

Abstract

Dual-layer, or stacked, detectors reduce motion artifacts in combined X-ray images, such as k-edge images, by acquiring low-and high-energy signals simultaneously. In this work we constructed a prototype single pixel dual-layer detector using amorphous selenium (a-Se) as the conversion material based on the same technology used for commercial large area flat panel imagers. A cascaded detector model was used to model the detector and for comparison with the experimental measurements. The detector was demonstrated to obtain contrast-enhanced mammography signals using an iodinated contrast agent. The experimentally obtained contrast was compared with the model and good agreement was found demonstrating the feasibility of the dual-layer technology. For comparison purposes, a single-layer single pixel detector capable of k-edge imaging but prone to motion artifacts (acquiring low-and high-energy signals sequentially) was also studied.

Original languageEnglish (US)
Article number6303849
Pages (from-to)1856-1861
Number of pages6
JournalIEEE Transactions on Nuclear Science
Volume59
Issue number5 PART 1
DOIs
StatePublished - 2012

Keywords

  • Amorphous selenium
  • X-ray detectors
  • contrast-enhanced mammography
  • digital mammography
  • dual-energy
  • dual-layer
  • k-edge imaging

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Nuclear Energy and Engineering
  • Electrical and Electronic Engineering

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