TY - GEN
T1 - IT-DSE
T2 - 42nd IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2023
AU - Yu, Ziyang
AU - Bail, Chen
AU - Hu, Shoubo
AU - Chen, Ran
AU - He, Taohai
AU - Yuan, Mingxuan
AU - Yu, Bei
AU - Wong, Martin
N1 - This work is supported by The Research Grants Council of Hong Kong SAR (No. CUHK14210723).
PY - 2023
Y1 - 2023
N2 - The microarchitecture design of processors faces growing complexity due to expanding design space and time-intensive verification processes. Utilizing historical design task data can improve the search process, but managing distribution discrepancies between different source tasks is essential for enhancing the search method's generalization ability. In light of this, we introduce IT-DSE, a microarchitecture searching framework with the surrogate model pre-trained to absorb knowledge from previous design tasks. The Feature Tokenizer-Transformer (FT-Transformer) serves as a backbone, facilitating feature extraction from source tasks even with varied design spaces. Concurrently, the invariant risk minimization (IRM) paradigm bolsters generalization ability under data distribution discrepancies. Further, IT-DSE exploits a combination of multi-objective Bayesian optimization and a model ensemble to discover Pareto-optimal designs Experimental results indicate that IT-DSE effectively harnesses the knowledge of existing microarchitecture designs and uncovers designs that outperform previous methods in terms of power, performance, and area (PPA).
AB - The microarchitecture design of processors faces growing complexity due to expanding design space and time-intensive verification processes. Utilizing historical design task data can improve the search process, but managing distribution discrepancies between different source tasks is essential for enhancing the search method's generalization ability. In light of this, we introduce IT-DSE, a microarchitecture searching framework with the surrogate model pre-trained to absorb knowledge from previous design tasks. The Feature Tokenizer-Transformer (FT-Transformer) serves as a backbone, facilitating feature extraction from source tasks even with varied design spaces. Concurrently, the invariant risk minimization (IRM) paradigm bolsters generalization ability under data distribution discrepancies. Further, IT-DSE exploits a combination of multi-objective Bayesian optimization and a model ensemble to discover Pareto-optimal designs Experimental results indicate that IT-DSE effectively harnesses the knowledge of existing microarchitecture designs and uncovers designs that outperform previous methods in terms of power, performance, and area (PPA).
UR - http://www.scopus.com/inward/record.url?scp=85181398841&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85181398841&partnerID=8YFLogxK
U2 - 10.1109/ICCAD57390.2023.10323961
DO - 10.1109/ICCAD57390.2023.10323961
M3 - Conference contribution
AN - SCOPUS:85181398841
T3 - IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
BT - 2023 42nd IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2023 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 28 October 2023 through 2 November 2023
ER -