Abstract
Very thin films of Ni, Ta, W, Pb, and Bi in a Ag matrix were irradiated at 77 K with 330 keV Kr ions at doses from 3 to 7×1015 ions/cm2 and analyzed at room temperature by backscattering of 1.9 MeV He+. The measured mixing efficiencies, Dt/φFD, for the various tracers correlate with their respective tracer impurity diffusion coefficients and impurity-vacancy binding energies in Ag. The results concur with previous ones with a Cu matrix and further support the idea that the parameters that are important for thermal diffusion are also important for ion mixing in a thermal spike.
Original language | English (US) |
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Pages (from-to) | 2449-2451 |
Number of pages | 3 |
Journal | Journal of Applied Physics |
Volume | 63 |
Issue number | 7 |
DOIs | |
State | Published - 1988 |
ASJC Scopus subject areas
- General Physics and Astronomy