Investigation of the impact of conductor surface roughness on interconnect frequency-dependent ohmic loss

Leonid Proekt, Andreas C Cangellaris

Research output: Contribution to journalConference articlepeer-review

Abstract

The impact of conductor surface roughness on the ohmic loss of interconnects is quantified through the application of perturbation theory to the development of the solution for the electromagnetic fields in the vicinity of a periodically corrugated air-metal interface. The analysis leads to the extraction of a frequency-dependent effective conductivity that captures the impact of surface roughness on interconnect ohmic loss. Availability of such an effective conductivity eliminates the need for detailed modeling of conductor roughness in interconnect parasitic extractors and full-wave electromagnetic field solvers aimed at signal integrity-driven electrical modeling.

Original languageEnglish (US)
Pages (from-to)1004-1010
Number of pages7
JournalProceedings - Electronic Components and Technology Conference
StatePublished - Jul 17 2003
Event53rd Electronic Components and Technology Conference 2003 - New Orleans LA, United States
Duration: May 27 2003May 30 2003

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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