Investigation of product burn-in failures due to powered NPN bipolar latching of active MOSFET rail clamps

Scott Ruth, James W. Miller, Alex Gerdemann, Michael Stockinger, Melanie Etherton, Mohamed Moosa, Allan Dobbin, Robert Mertens, Kuo Hsuan Meng, Elyse Rosenbaum, Paolo Colombo, Martina Cordoni, Nicolas Guitard

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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