Investigation of product burn-in failures due to powered NPN bipolar latching of active MOSFET rail clamps

Scott Ruth; James W. Miller; Alex Gerdemann; Michael Stockinger; Melanie Etherton; Mohamed Moosa; Allan Dobbin; Robert Mertens; Kuo Hsuan Meng; Elyse Rosenbaum; Paolo Colombo; Martina Cordoni; Nicolas Guitard

Investigation of product burn-in failures due to powered NPN bipolar latching of active MOSFET rail clamps

Scott Ruth, James W. Miller, Alex Gerdemann, Michael Stockinger, Melanie Etherton, Mohamed Moosa, Allan Dobbin, Robert Mertens, Kuo Hsuan Meng, Elyse Rosenbaum, Paolo Colombo, Martina Cordoni, Nicolas Guitard

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

A product utilizing 5V RC clamps suffered EOS damage during BI due to marginal V_hold of the clamp NMOS. Powered TLP was used to mimic BI noise events and to explain clamp response across a range of starting V _supply levels. Alternate clamp configurations were explored to improve V_hold.

Original language	English (US)
Title of host publication	Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2013
State	Published - Oct 16 2013
Event	2013 35th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2013 - Las Vegas, NV, United States Duration: Sep 8 2013 → Sep 13 2013

Publication series

Name	Electrical Overstress/Electrostatic Discharge Symposium Proceedings
ISSN (Print)	0739-5159

Other

Other	2013 35th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2013
Country/Territory	United States
City	Las Vegas, NV
Period	9/8/13 → 9/13/13

ASJC Scopus subject areas

Electrical and Electronic Engineering

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Ruth, S., Miller, J. W., Gerdemann, A., Stockinger, M., Etherton, M., Moosa, M., Dobbin, A., Mertens, R., Meng, K. H., Rosenbaum, E., Colombo, P., Cordoni, M., & Guitard, N. (2013). Investigation of product burn-in failures due to powered NPN bipolar latching of active MOSFET rail clamps. In Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2013 Article 6635940 (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Investigation of product burn-in failures due to powered NPN bipolar latching of active MOSFET rail clamps. / Ruth, Scott; Miller, James W.; Gerdemann, Alex et al.
Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2013. 2013. 6635940 (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Ruth, S, Miller, JW, Gerdemann, A, Stockinger, M, Etherton, M, Moosa, M, Dobbin, A, Mertens, R, Meng, KH, Rosenbaum, E, Colombo, P, Cordoni, M & Guitard, N 2013, Investigation of product burn-in failures due to powered NPN bipolar latching of active MOSFET rail clamps. in Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2013., 6635940, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 2013 35th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2013, Las Vegas, NV, United States, 9/8/13.

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title = "Investigation of product burn-in failures due to powered NPN bipolar latching of active MOSFET rail clamps",

abstract = "A product utilizing 5V RC clamps suffered EOS damage during BI due to marginal Vhold of the clamp NMOS. Powered TLP was used to mimic BI noise events and to explain clamp response across a range of starting V supply levels. Alternate clamp configurations were explored to improve Vhold.",

author = "Scott Ruth and Miller, {James W.} and Alex Gerdemann and Michael Stockinger and Melanie Etherton and Mohamed Moosa and Allan Dobbin and Robert Mertens and Meng, {Kuo Hsuan} and Elyse Rosenbaum and Paolo Colombo and Martina Cordoni and Nicolas Guitard",

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series = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings",

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AU - Ruth, Scott

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AU - Gerdemann, Alex

AU - Stockinger, Michael

AU - Etherton, Melanie

AU - Moosa, Mohamed

AU - Dobbin, Allan

AU - Mertens, Robert

AU - Meng, Kuo Hsuan

AU - Rosenbaum, Elyse

AU - Colombo, Paolo

AU - Cordoni, Martina

AU - Guitard, Nicolas

PY - 2013/10/16

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N2 - A product utilizing 5V RC clamps suffered EOS damage during BI due to marginal Vhold of the clamp NMOS. Powered TLP was used to mimic BI noise events and to explain clamp response across a range of starting V supply levels. Alternate clamp configurations were explored to improve Vhold.

AB - A product utilizing 5V RC clamps suffered EOS damage during BI due to marginal Vhold of the clamp NMOS. Powered TLP was used to mimic BI noise events and to explain clamp response across a range of starting V supply levels. Alternate clamp configurations were explored to improve Vhold.

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M3 - Conference contribution

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SN - 9781585372324

T3 - Electrical Overstress/Electrostatic Discharge Symposium Proceedings

BT - Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2013

T2 - 2013 35th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2013

Y2 - 8 September 2013 through 13 September 2013

ER -

Investigation of product burn-in failures due to powered NPN bipolar latching of active MOSFET rail clamps

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