Abstract
Using atomically smooth epitaxial silver films, new optical permittivity highlighting significant loss reduction in the visible frequency range is extracted. Largely enhanced propagation distances of surface plasmon polaritons are measured, confirming the low intrinsic loss in silver. The new permittivity is free of extrinsic spectral features associated with grain boundaries and localized plasmons inevitably present in thermally deposited films.
Original language | English (US) |
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Pages (from-to) | 6106-6110 |
Number of pages | 5 |
Journal | Advanced Materials |
Volume | 26 |
Issue number | 35 |
DOIs | |
State | Published - Sep 17 2014 |
Externally published | Yes |
Keywords
- ellipsometry
- epitaxial growth
- optical constants
- plasmon
ASJC Scopus subject areas
- General Materials Science
- Mechanics of Materials
- Mechanical Engineering