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Interval-valued reduced-order statistical interconnect modeling
James D. Ma, Rob A. Rutenbar
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Keyphrases
Asymptotic Waveform Evaluation
50%
Capacitance
50%
Classical Model
50%
Compact Intervals
50%
Interconnect Modeling
100%
Interval Representation
50%
Macromodeling
50%
Manufacturing Variations
50%
Mean Delay
50%
Model Order Reduction
50%
Numerical Operations
50%
Order Reduction
100%
Parameter Variation
50%
Probability Density Function
50%
Range Uncertainty
50%
RLC Parameters
100%
Scalar
50%
Statistical Interpretation
50%
Statistical Sampling
50%
Statistical Variation
50%
Mathematics
Approximates
100%
Asymptotic Analysis
100%
Classical Model
100%
Compact Interval
100%
Parameter Variation
100%
Probability Density Function
100%
Reduction Method
100%
Standard Deviation
100%
Engineering
Compact Interval
33%
Interconnects
100%
Original Circuit
33%
Parameter Variation
33%
Probability Density Function
33%
Statistical Variation
33%