TY - GEN
T1 - Interval-valued reduced order statistical interconnect modeling
AU - Ma, James D.
AU - Rutenbar, Rob A.
PY - 2004
Y1 - 2004
N2 - We show how recent advances in the handling of correlated interval representations of range uncertainty can be used to predict the impact of statistical manufacturing variations on linear interconnect. We represent correlated statistical variations in RLC parameters as sets of correlated intervals, and show how classical model order reduction methods - AWE and PRIMA - can be re-targeted to compute interval-valued, rather than scalar-valued reductions. By applying a statistical interpretation and sampling to the resulting compact interval-valued model, we can efficiently estimate the impact of variations on the original circuit. Results show the technique can predict mean delay with errors between 5-10%, for correlated RLC parameter variations up to 35%
AB - We show how recent advances in the handling of correlated interval representations of range uncertainty can be used to predict the impact of statistical manufacturing variations on linear interconnect. We represent correlated statistical variations in RLC parameters as sets of correlated intervals, and show how classical model order reduction methods - AWE and PRIMA - can be re-targeted to compute interval-valued, rather than scalar-valued reductions. By applying a statistical interpretation and sampling to the resulting compact interval-valued model, we can efficiently estimate the impact of variations on the original circuit. Results show the technique can predict mean delay with errors between 5-10%, for correlated RLC parameter variations up to 35%
UR - http://www.scopus.com/inward/record.url?scp=16244379543&partnerID=8YFLogxK
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U2 - 10.1109/ICCAD.2004.1382621
DO - 10.1109/ICCAD.2004.1382621
M3 - Conference contribution
AN - SCOPUS:16244379543
SN - 0780387023
T3 - IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
SP - 460
EP - 467
BT - ICCAD-2004 - IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers
T2 - ICCAD-2004 - IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers
Y2 - 7 November 2004 through 11 November 2004
ER -