Interplane penetration depth and coherent transport in organic superconductors

Tyson A. Olheiser, Zane Shi, David D. Lawrie, Russell W. Giannetta, John A. Schlueter

Research output: Contribution to journalArticlepeer-review

Abstract

Measurements of the interlayer penetration depth λ □ have been performed on single crystals of the organic superconductors κ- (ET) 2 Cu [N (CN) 2] Br and κ- (ET) 2 Cu (NCS) 2. We find that λ □ (0) ≈ μm for both materials. The normalized superfluid density ρ □ = [λ □ (0) / λ □ (T)] 2 may be fit equally well to a power law 1-ρ □□ Tn with n=1.3-1.5 or to the form 1 - ρ□ = α (T2 / TC) / (T+ T□), consistent with a d-wave pairing state with impurity scattering. The data imply coherent transport between conducting planes, in agreement with recent magnetoresistive measurements and in contrast to the copper oxides.

Original languageEnglish (US)
Article number054519
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume80
Issue number5
DOIs
StatePublished - Aug 27 2009

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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