Abstract
Flip chip assemblies used in electronic packaging consist of three main components (layers): chip, underfill, and substrate. In this paper, the flip chip assembly is represented as a bi-material strip consisting of the chip and underfill. Our analysis is focused on delamination along the chip-underfill interface due to thermal loading. The underfill is modeled as a composite material made of a polymer matrix and silica particles. Interfacial stresses are studied for several particle configurations: cases of one, two, or three particles near the interface and 30 different random particle arrangements. Interfacial fracture is investigated by evaluating the J integral and stress intensity factors. Statistics of random particle arrangements in the underfill are also discussed. The interfacial stress and fracture analyses give the same trends.
Original language | English (US) |
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Pages (from-to) | 400-413 |
Number of pages | 14 |
Journal | Journal of Electronic Packaging, Transactions of the ASME |
Volume | 125 |
Issue number | 3 |
DOIs | |
State | Published - Sep 2003 |
Externally published | Yes |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Mechanics of Materials
- Computer Science Applications
- Electrical and Electronic Engineering